EC8010 wrote: ↑Thu Jun 18, 2026 10:22 am
Interesting stuff. Some numbers on the noise in different orientations would be nice, although the visual comparison is good. I imagine the instrument has cursors, so it should be possible to measure the width of those peaks at half maximum amplitude (FWHM). I would expect the noise in all orientations to be similar,
provided that the crystal has had sufficient time to settle its internal stresses in that orientation. That might take significant time.
I've been seeing some unexplained variations in the measured stdDev, so I'm reluctant to give figures at the moment.
Those measures were
very fast; 100 samples over 50s per orientation, with maybe 30s rest after changing orientation. On returning to the "0" orientation, the frequency and noise were essentially unchanged (and lower). Sufficient to show principle, no more.
What constitutes "significant time" is an interesting question, one which I don't have a good feel for. I can't rule out such changes being behind the unexplained variations, in which case "overnight" would be a starting point. Calls for more investigation.
The cable results are also interesting. As it happens, I've been measuring noise in phenolic insulators recently. I apply 183V (not a special voltage, but it's what I have that is quiet) across an insulator, measure the leakage current with an electrometer, and do an FFT of its noise. What I see is (roughly) 1/f noise. This is excess noise as produced by thick film resistors and is dependent on composition (and applied voltage). If the cable you're referring to has a direct voltage on it, it could be producing excess noise. You can make a given characteristic impedance using a variety of dielectrics, and material purity (shunt R) won't make much difference to Z0.
The cables are bog-standard whatever I have lying around. The OCXO output is a 511ohm resistor driving a 3:1 transformer, that drives the cable and the 50R load inside the analyser. 1.5Vpp sine wave, mean value 0V.
Observing the the display as the histogram accumulates, the individual measurements do not show a trend; they are scattered across the normal distribution. Each measurement is averaged over 5s, and I accumulate 10 measurements before updating the histogram. That
might limit the scope for 1/f noise.
Regarding the distribution amplifier scenario, I suppose a lot depends on the PLL at the various destinations. I'm not really clued up on RF, so how often is phase noise more important than absolute accuracy of frequency? Won't the low-pass filter implicit in a PLL ignore most phase noise?
In a comms system, phase noise translates to clock jitter, and that can badly affect received SNR[1]. Hence people prize low phase noise sources and analysers. Contrariwise, the frequency difference between tx and rx is accommodated by the PLL in the receiver. Larger frequency difference can imply a longer time for a PLL to come into lock, but (like metastability) that is non-deterministic. Not sure about frequency locked loops, though. Overall it is a complex topic, the subject of much engineering
[1] to pick an article/pictures at random, see
https://www.edn.com/how-to-relate-eye-m ... ts-to-ber/ and mentally extrapolate from a two-level constellation to a 4 or 8 level constellation.